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  1. Fibics Home Page

    Fibics Incorporated provides analysis solutions to semiconductor and materials science / metallurgy clients, specializing in focused ion beam (FIB), secondary ...
    GIF2
    milling2
    uniform2
    semiconductor2
    thin2
    TEM1
    failure analysis1
    defect1
    defects1
    tomography1
    EELS1
    FIB1
    microsurgery1
    micromachining1
    EDX1
    dislocation1
    cross section1
    cross-section1
    Focused ion beam1
    decapsulation1
    plan view1
    LMIS1
    circuit edit1
    uniformly1
    device modification1
    focussed ion beam0
    gallium beam0
    liquid metal ion source0
    orientation contrast0
    serial sectioning0
    TEM cross-section0

    www.fibics.com - 2009-02-07

  2. SEM TEM and FIB Service Lab

    Fast turnaround lab services for SEM, TEM & FIB (Focused Ion Beam), chip/circuit/ device edit /modification, TEM foil sample prep, cross sections, high ...
    training5
    SEM3
    chip2
    high resolution1
    cryo1
    cross section1
    circuit edit1
    device modification1
    failure and process analysis0
    Fast FIB service lab0
    plastic package decapsulation0
    TEM foil sample prep0

    www.nanoscopeservices.com - 2009-02-06

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